Instrument features
- Can measure the thickness of the non-magnetic layer on the magnetic metal the non-conduction layer on the non-magnetic metal matrix is measured.
- Two patterns of working: pattern of direct and pattern of group.
- Five statistical data: Mean Value, Maximum Value, Lowest Value, Measurement Time and Standard Deviation.
- Saving function: capable of 500 sets of measurement value.
Main technical parameters
| Probe Type |
F |
N |
| Principle |
Magnetic Induction |
Eddy Current |
| Measuring Range |
0~1250μm |
0~1250μm，Chromium plating layer on copper（0~40μm） |
| Resolution |
0.1μm（0~50μm），1μm（＞50μm） |
| Eorror |
3%H＋1μm（H represents actual value） |
| Indication Error |
Calibration（μm） |
±（3%H+1） |
±（3%H+1） |
| Test Conditions |
minimum radius of curvature（μm） |
convex 1.5 |
convex 3 |
| diameter of the smallest area（μm） |
Φ7 |
Φ5 |
| Critical thickness（㎜） |
0.5 |
0.3 |
| working voltage |
3*1.5V |
| overall dimension |
155㎜*68㎜*27㎜ |
| Weight |
230g |
| standard configuration |
Host, Probe (F or N), substrate (Iron or aluminum), standard chip |
