Do You Wish to Know The Difference Between Optical Emission Spectroscopy and Handheld XRF Analyzer
Views : 4301
Author : Jerry He
Update time : 2019-10-21 14:41:56
The Optical Emission Spectroscopy is a quantitative analysis with accurate, repeatable and long-term stability. The Handheld XRF Analyzer is qualitative analyses used to identify material grades and are easy to test in the field, but cannot measure the more demanding elements such as carbon.
Optical Emission Spectroscopy Principle
Optical Emission Spectroscopy is the most sensitive and accurate detector in the field of solid metal material analysis. It can meet the complex requirements of metal spectrum analysis to the maximum extent. It can analyze materials: Fe, Al, Cu, Ni, Co, Ti, Zn, Mg, Pb. , Sn and other substrates. When the metal is excited by energy, according to quantum mechanics theory, the shell electrons of the atom are excited to the outer orbit of the higher energy level and are in an unstable state. Under certain conditions, when it transitions from a high energy level to a low energy level, it emits photons and emits characteristic lines. Each element has different characteristic lines, which are split by an optical system, disperse into a series of continuous spectra sorted by wavelength, and then directly convert the optical signal into an electrical signal through a photoelectric conversion element. Finally, the computer measurement system can determine the percentage of the element by calculating the intensity of the characteristic line of an element.
Handheld XRF Analyzer Principle
Handheld XRF Analyzer is fast, non-destructive analysis of alloy materials. Applications: aerospace, alloy smelting, petrochemical construction, pressure vessels, stainless steel manufacturing, scrap metal recycling, petrochemical, weld inspection, alloy sorting and other fields. The handheld spectrometer is mainly composed of X-ray tube, detector, CPU and memory. The principle is that when high-energy X-rays with energy higher than the electron binding energy of the inner layer of the atom collide with the atom, an inner layer electron is expelled and a hole appears. The entire atomic system is in an unstable state. When the outer layer of electrons transitions to the hole, a photoelectron is generated. The struck photon may be absorbed again and ejected from the outer layer of another secondary photoelectron. Effect, also known as secondary photoelectric effect or no radiation effect. The secondary optoelectronics that are evicted are called Auger electrons. When the energy released by the outer layer of electrons into the inner layer is not absorbed by the atom but released as a photon, X-ray fluorescence is generated, and its energy is equal to the energy difference between the two levels. Therefore, the energy or wavelength of ray fluorescence is characteristic and has a one-to-one correspondence with elements. According to Moseley's law, as long as the wavelength of fluorescent X-rays is measured, the type of elements can be known, which is the basis of qualitative analysis of fluorescent X-rays.
