Instrument features
- Can measure the thickness of the non-magnetic layer on the magnetic metal the non-conduction layer on the non-magnetic metal matrix is measured.
- Two patterns of working: pattern of direct and pattern of group.
- Five statistical data: Mean Value, Maximum Value, Lowest Value, Measurement Time and Standard Deviation.
- Saving function: capable of 500 sets of measurement value.
Main technical parameters
Probe Type |
F |
N |
Principle |
Magnetic Induction |
Eddy Current |
Measuring Range |
0~1250μm |
0~1250μm,Chromium plating layer on copper(0~40μm) |
Resolution |
0.1μm(0~50μm),1μm(>50μm) |
Eorror |
3%H+1μm(H represents actual value) |
Indication Error |
Calibration(μm) |
±(3%H+1) |
±(3%H+1) |
Test Conditions |
minimum radius of curvature(μm) |
convex 1.5 |
convex 3 |
diameter of the smallest area(μm) |
Φ7 |
Φ5 |
Critical thickness(㎜) |
0.5 |
0.3 |
working voltage |
3*1.5V |
overall dimension |
155㎜*68㎜*27㎜ |
Weight |
230g |
standard configuration |
Host, Probe (F or N), substrate (Iron or aluminum), standard chip |